● TEM quality is competitive worldwide
● 5nm FinFET is available
● 2-3 working-day to provide TEM report (sample arrvied)
HOT! FEI Talos, OSIRIS/TEM + JOEL TEM
● FEI Talos
● FEI OSIRIS
● JEOL 2100F
▍TEM images of Samsung application processes
▍EDS mapping of intel CUPs
Microstructure analysis: lattice image, IC process monitor, crystal defect observation. Phase identification and composition analysis.
Mr. Yao ext. 6237
E-mail: jack_yao@msscorps.com