CONTACT US
汎銓科技
南京泛铨
MSS JAPAN 株式会社
ABOUT US
NEWS
TECHNOLOGY INNOVATIONS
SERVICE
(USA) Materials Analysis
(TW) Materials Analysis
(TW) IC Circuit Repair
(TW) Failure Analysis
(TW) Chemical Engineering Analysis
CAREERS
Home
SERVICE
(TW) Failure Analysis
Nano Prober System
Nano Prober System
▍Figure Hitachi N-6800 image
• Support up to 7nm process transistor electrical measurement (N6000 can only support up to 40nm)
• Simultaneous measurement of 6 needles at the same time (detailed specifications are listed in the table on the next page)
• Support low temperature measurement, – 40 °C
• With current amplifier can have EBIC, EBAC, and EBIRCH functions
▍Spec.
▍Figure N-6000 with Agilent B1500A
▍Spec.
▍Eng. Contact Window
Mr. Lee ext#6858
E-mail: pfa@msscorps.com
團體服
軸承
系統家具
襪
電動沙發
餐飲設備
襪子
印刷帆布袋
室內設計
內褲
男內褲
購物袋
春酒餐廳