OBIRCH

OBIRCH Analysis detects fluctuation in electricity that occur when an infrared laser is irradiated to find leakage current paths and contact area resistance failure in LSI devices.

▍Equipment

Figure. Hamamatsu uAMOS-200

▍Application

▍Eng. Contact Window

Mr.Hsu ext.6863/3399
E-mail: emmi@msscorps.com