"Nexsa" XPS System offers fully automated multi-technique analysis along with high throughput without sacrificing research grade results. Integration of multiple analytical techniques like ISS, UPS and REELS , allows users to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra thin films, nanotechnology development and many other applications.
Material Analysis and Development：Nexsa spectrometer delivers flexibility to maximize the potential of your material. Flexibility in the forms of multiple-integrated technique options for true correlative data analysis and high throughput while maintain research quality results.
圖- Nexsa: Small spot XPS, multi-technique analysis
Bring sample features into focus with SnapMap's optical view. The optical view helps you pinpoint areas of interest quickly while developing a fully focused XPS image to further define your experiment.