"Nexsa" XPS System offers fully automated multi-technique analysis along with high throughput without sacrificing research grade results. Integration of multiple analytical techniques like ISS, UPS and REELS , allows users to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra thin films, nanotechnology development and many other applications.
Material Analysis and Development:Nexsa spectrometer delivers flexibility to maximize the potential of your material. Flexibility in the forms of multiple-integrated technique options for true correlative data analysis and high throughput while maintain research quality results.
圖- Nexsa: Small spot XPS, multi-technique analysis
Bring sample features into focus with SnapMap's optical view. The optical view helps you pinpoint areas of interest quickly while developing a fully focused XPS image to further define your experiment.
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E-mail: huini_huang@msscorps.com