Superior CP method

CP (cross-section polish) is a commonly-used tool for cross-section sample preparation with ion beams. How to avoid structural deformation and curtain effects during preparation to cause artifacts, especially for heterogenous materials, is a task. MSS delivers a new CP method, CEF (curtain effect free), to drastically improve the quality of cross-section sample preparation.

a is a SEM image of a sample prepared with MSS CP method, CEF. Zoom-in image of a at an area marked by the green dotted rectangle is shown in b. No clear curtain effects are observed. Higher magnification image at the Cu surface, in c, where pristine surface roughness is well preserved after the CEF.