OBIRCH

OBIRCH Analysis detects fluctuation in electricity that occur when an infrared laser is irradiated to find leakage current paths and contact area resistance failure in LSI devices.

 

Equipment

 

Figure. Hamamatsu uAMOS-200

 

 

 

Application

 

 

 



Eng. Contact Window

Mr.Hsu  ext.6863/3399  

E-mail: emmi@msscorps.com