XPS(X-ray photoelectron spectroscopy) 


"Nexsa" XPS System offers fully automated multi-technique analysis along with high throughput without sacrificing research grade results. Integration of multiple analytical techniques like ISS, UPS and REELS , allows users to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra thin films, nanotechnology development and many other applications.


Material Analysis and Development:Nexsa spectrometer delivers flexibility to maximize the potential of your material. Flexibility in the forms of multiple-integrated technique options for true correlative data analysis and high throughput while maintain research quality results.




Figure. Nexsa: Small spot XPS, multi-technique analysis




▪  Insulator Analysis
▪  High Performance Spectroscopy
▪  Depth Profiling
▪  Multi-technique Integration
▪  Dual-mode ion source for expanded depth profiling capabilities
▪  SnapMap's optical view
Bring sample features into focus with SnapMap's optical view. The optical view helps you pinpoint areas of interest quickly while developing a fully focused XPS image to further define your experiment.

▪  Glass coatings、Polymers

▪  Batteries、Graphene

▪  Solar cells、OLEDs 、Metals & oxides 

▪  Bio-surfaces、Thin Films

▪  Semiconductors、Ceramics

▪  Catalysts、Nanomaterials….



Eng. Contact Window

Ms.Huang  ext.6218

E-mail: huini_huang@msscorps.com