Nano Prober System

N-6000 is a SEM-based nano probing instrument for 90-65-45(32) nm device generations. With high precision pieze-driven actuators equipped, N-6000 directly touches its fine probes on actual circuit of device, and make it possible to measure electrical characteristics of deep-submicron electrical structures, like single MOS transistor, interconnect and so on.

 

Equipment

 

Figure. N-6000 with Agilent B1500A

    

 

 

 

 

Specification

 

 

Application

 

•  Measure MOS transistor characteristics.
•  Submicron semiconductor device failure analysis.
•  MEMS Nanostructure and nanofabrication research.
•  Microelectromechanical IC microstructure research.
•  Surface science research.
 
 
Case Sharing
 

 

 



Eng. Contact Window
Mr. Lee  ext.6858

E-mail: pfa@msscorps.com